Title :
Temperature dependence of the Brillouin frequency shift and the linewidth of the LA mode in the ferroelectric phase of PZT-x (PbZr1−xTixO3)
Author :
Yurtseven, H. ; Sisman Korkmaz, C. ; Kiraci, A.
Author_Institution :
Dept. of Phys., Middle East Tech. Univ., Ankara, Turkey
Abstract :
The temperature dependence of the Brillouin frequency and the linewidth of the LA mode is studied for the concentration of x=0.45 in the ferroelectric phase of PbZr1-xTixO3 (PZT-x) within the temperature range of 443 to 656 K (TC=657 K). Using the experimental data for the Brillouin frequency of the LA mode as an order parameter below TC the temperature dependence of the linewidth (FWHM) is calculated by the pseudospin-phonon coupled model and the energy fluctuation model for the lead titanate zirconate (x=0.45). Additionally, the activation energies are compared from the damping constant (linewidth) using both models for the temperature range of 443 to 656 K in the ferroelectric phase of PbZr1-xTixO3. Our calculated values for the damping constant are in agreement with the observed data for the ferroelectric phase of PbZr1-xTixO3 single crystals. The activation energies calculated from both models are much higher in the ferroelectric phase than the value of kBTC=0.056 eV at the transition temperature for PbZr1-xTixO3 (x=0.45).
Keywords :
Brillouin spectra; ferroelectric ceramics; ferroelectric transitions; lead compounds; spin-phonon interactions; Brillouin frequency; FWHM; LA mode linewidth; PZT; activation energy; damping constant; energy fluctuation model; ferroelectric phase transition temperature; lead titanate zirconate; order parameter; pseudospin-phonon coupled model; temperature 443 K to 656 K; temperature dependence; Damping; Data models; Fluctuations; Phonons; Scattering; Temperature dependence; Temperature distribution; Brillouin frequency; Ferroelectricity; PbZr1−xTixO3; damping constant (FWHM); order parameter;
Conference_Titel :
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location :
Singapore
DOI :
10.1109/ISAF.2015.7172653