• DocumentCode
    336542
  • Title

    Is DVT excluded by normal thermal imaging?-an outcome study of 700 cases

  • Author

    Harding, J.R.

  • Author_Institution
    Dept. of Clinical Radiol., St. Woolos Hosp., Newport
  • Volume
    2
  • fYear
    1997
  • fDate
    30 Oct-2 Nov 1997
  • Firstpage
    649
  • Abstract
    Untreated deep vein thrombosis (DVT) has a significant morbidity and mortality as it cause cause pulmonary embolism (PE). This risk is substantially eliminated by effective anticoagulation, which prevents further thrombus formation in the leg veins, allowing gradual natural absorption of the existing blood clot, but this treatment has risks of its own and is not indicated without a definite diagnosis. Clinical diagnosis is extremely misleading, so accurate clinical tests are required to rule out or rule in clinically suspected DVT. There are risks and disadvantages to the most commonly utilised conventional tests for DVT, over one-third of which examinations can be avoided by performing thermal imaging as the initial investigation, which excludes DVT when normal. This outcome study followed up patients with clinically suspected DVT who were not further investigated or treated following normal thermal imaging, and showed that no patients developed PE following normal thermography with no further investigation for DVT and withholding of anticoagulant therapy
  • Keywords
    biomedical imaging; biothermics; blood vessels; infrared imaging; accurate clinical tests; anticoagulant therapy; blood clot absorption; effective anticoagulation; leg veins; medical diagnostic imaging; morbidity; mortality; normal thermal imaging; pulmonary embolism; thermography; untreated deep vein thrombosis; Clinical diagnosis; Computer aided software engineering; Hospitals; Medical treatment; Radiography; Radiology; Temperature; Testing; Ultrasonic imaging; Veins;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.757697
  • Filename
    757697