DocumentCode :
3365516
Title :
Epitaxial growth of an MgO buffer layer and electrode layer on Si for Pb(Zr,Ti)O3 by PLD
Author :
Li, X. ; Sakurai, A. ; Shiratsuyu, K. ; Tanaka, K. ; Sakabe, Y.
Author_Institution :
Murata Mfg. Co., Ltd, Kyoto, Japan
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
909
Abstract :
Thin films of MgO were grown on Si(100) substrates as a buffer layer for the epitaxial growth of films of Pb(Zr,Ti)O3. A layer of Ir or Pt was also grown on MgO/Si as a bottom electrode layer by pulsed laser deposition. In situ reflection high-energy electron diffraction and an X-ray pole figure confirmed the epitaxial relationship between the film of MgO and the Si(100) substrate, as well as between the layer of Ir or Pt and MgO. The surface and cross-sectional morphologies of films were evaluated by atomic force microscopy and scanning electron microscopy, respectively. The Ir and Pt electrode layers grown on MgO/Si had smooth surfaces good crystallinity. PZT films were also successfully grown epitaxially on the Ir/MgO/Si and Pt/MgO/Si by metal-organic chemical vapor deposition
Keywords :
MOCVD; X-ray diffraction; atomic force microscopy; epitaxial layers; ferroelectric thin films; lead compounds; magnesium compounds; pulsed laser deposition; reflection high energy electron diffraction; scanning electron microscopy; silicon; surface structure; texture; vapour phase epitaxial growth; Ir; Ir electrode layer; MOCVD; MgO; MgO buffer layer; PLD; PZT; Pb(Zr,Ti)O3; PbZrO3TiO3; Pt; Pt electrode layer; Si; Si (100) substrates; X-ray pole figure; atomic force microscopy; bottom electrode layer; cross-sectional morphologies; electrode layer; epitaxial growth; epitaxial relationship; in situ reflection high-energy electron diffraction; pulsed laser deposition; scanning electron microscopy; surface morphologies; thin films; Atomic force microscopy; Buffer layers; Electrodes; Electrons; Epitaxial growth; Optical films; Pulsed laser deposition; Semiconductor films; Substrates; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
ISSN :
1099-4734
Print_ISBN :
0-7803-5940-2
Type :
conf
DOI :
10.1109/ISAF.2000.942465
Filename :
942465
Link To Document :
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