DocumentCode :
3365616
Title :
A dissimilarity kernel with local features for robust facial recognition
Author :
Huang, Weilin ; Yin, Hujun
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
3785
Lastpage :
3788
Abstract :
Local binary pattern (LBP) has recently been proposed for texture analysis and local feature description and has also been applied to face recognition with promising results. However, besides the descriptors, a suitable similarity measure that can efficiently learn to distinguish facial features is also important. In this paper, a novel framework for robust face recognition is presented that considers both local and global features by using multi-resolution LBP descriptors. The framework can tolerate variations in expression, lighting condition and occlusion. A weighted distance measure is used to learn the dissimilarity between sets of LBP features. We formulate the distance function as a conditionally positive semi-definite (CPD) kernel, thus making it suitable for kernel-based algorithms such as support vector machines (SVMs) whose optimal solutions are guaranteed. We show that by defining it in a Hilbert space, the proposed CPD kernel has advantages over traditional methods computing the l2 distances in the Euclidean space. The experiments show that the approach is efficient and significantly outperforms the current state-of-the-art methods on the publicly available AR face database.
Keywords :
Hilbert spaces; face recognition; Hilbert space; dissimilarity kernel; distance function; global feature; kernel based algorithm; local binary pattern; local feature; positive semidefinite kernel; robust facial recognition; texture analysis; Face; Face recognition; Histograms; Kernel; Lighting; Robustness; Training; Local binary pattern; conditionally positive semi-definite kernel; dissimilarity measure; local feature; robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5653495
Filename :
5653495
Link To Document :
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