DocumentCode
3365621
Title
Robustness analysis of soft error accumulation in SRAM-FPGAs using FLIPPER and STAR/RoRA
Author
Alderighi, M. ; Casini, F. ; D´Angelo, S. ; Mancini, M. ; Codinachs, D. Merodio ; Pastore, S. ; Sorrenti, G. ; Sterpone, L. ; Weigand, R. ; Violante, M.
Author_Institution
Ist. di Astrofis. Spaziale e Fis. Cosmica, Ist. Naz. di Astrofis., Milan, Italy
fYear
2008
fDate
10-12 Sept. 2008
Firstpage
157
Lastpage
161
Abstract
We describe a methodology for analyzing the robustness of circuits implemented by SRAM-based FPGAs against the accumulation of soft errors within the configuration memory. A detailed analysis of the fault injection data is presented.
Keywords
SRAM chips; field programmable gate arrays; logic design; FLIPPER; RoRA; SRAM-FPGA; STAR; configuration memory; fault injection data; robustness analysis; soft error accumulation; Circuit faults; Estimation; Field programmable gate arrays; Robustness; Sensitivity; Single event upset; Tunneling magnetoresistance; Dependability; Fault Tolerance Fault Injection; Field Programmable Gate Arrays (FPGA); Reprogrammable FPGA; Single Event Effects; Triple Modular Redundancy (TMR);
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location
Jyvaskyla
ISSN
0379-6566
Print_ISBN
978-1-4577-0481-9
Type
conf
DOI
10.1109/RADECS.2008.5782703
Filename
5782703
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