Title :
Robustness analysis of soft error accumulation in SRAM-FPGAs using FLIPPER and STAR/RoRA
Author :
Alderighi, M. ; Casini, F. ; D´Angelo, S. ; Mancini, M. ; Codinachs, D. Merodio ; Pastore, S. ; Sorrenti, G. ; Sterpone, L. ; Weigand, R. ; Violante, M.
Author_Institution :
Ist. di Astrofis. Spaziale e Fis. Cosmica, Ist. Naz. di Astrofis., Milan, Italy
Abstract :
We describe a methodology for analyzing the robustness of circuits implemented by SRAM-based FPGAs against the accumulation of soft errors within the configuration memory. A detailed analysis of the fault injection data is presented.
Keywords :
SRAM chips; field programmable gate arrays; logic design; FLIPPER; RoRA; SRAM-FPGA; STAR; configuration memory; fault injection data; robustness analysis; soft error accumulation; Circuit faults; Estimation; Field programmable gate arrays; Robustness; Sensitivity; Single event upset; Tunneling magnetoresistance; Dependability; Fault Tolerance Fault Injection; Field Programmable Gate Arrays (FPGA); Reprogrammable FPGA; Single Event Effects; Triple Modular Redundancy (TMR);
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
Print_ISBN :
978-1-4577-0481-9
DOI :
10.1109/RADECS.2008.5782703
