• DocumentCode
    3365640
  • Title

    A new technique for SET pulse width measurement in chains of inverters using pulsed laser irradiation

  • Author

    Ferlet-Cavrois, V. ; McMorrow, D. ; Kobayashi, D. ; Fel, N. ; Melinger, J.S. ; Paillet, P. ; Pouget, V. ; Essely, F. ; Baggio, J. ; Girard, S. ; Flores, R.S. ; Schwank, J.R. ; Dodd, P.E. ; Shaneyfelt, M.R. ; Hirose, K. ; Saito, H.

  • Author_Institution
    DIF, Commissariat a l´´Energie Atomique, Arpajon, France
  • fYear
    2008
  • fDate
    10-12 Sept. 2008
  • Firstpage
    169
  • Lastpage
    174
  • Abstract
    A new technique is developed to precisely measure the width of propagating voltage transients induced by irradiation of inverter chains. The technique is based on the measurement of the supply current in a detection inverter.
  • Keywords
    electric current measurement; laser beams; logic gates; radiation hardening (electronics); transients; voltage measurement; SET pulse width measurement; detection inverter; inverter chains; propagating voltage transients width measurement; pulsed laser irradiation; single event transient; supply current measurement; Current measurement; Inverters; Measurement by laser beam; Oscilloscopes; Transient analysis; Transistors; Voltage measurement; SET width; Single Event Transient; chains of inverters; pulsed laser irradiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
  • Conference_Location
    Jyvaskyla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0481-9
  • Type

    conf

  • DOI
    10.1109/RADECS.2008.5782706
  • Filename
    5782706