Title :
A new technique for SET pulse width measurement in chains of inverters using pulsed laser irradiation
Author :
Ferlet-Cavrois, V. ; McMorrow, D. ; Kobayashi, D. ; Fel, N. ; Melinger, J.S. ; Paillet, P. ; Pouget, V. ; Essely, F. ; Baggio, J. ; Girard, S. ; Flores, R.S. ; Schwank, J.R. ; Dodd, P.E. ; Shaneyfelt, M.R. ; Hirose, K. ; Saito, H.
Author_Institution :
DIF, Commissariat a l´´Energie Atomique, Arpajon, France
Abstract :
A new technique is developed to precisely measure the width of propagating voltage transients induced by irradiation of inverter chains. The technique is based on the measurement of the supply current in a detection inverter.
Keywords :
electric current measurement; laser beams; logic gates; radiation hardening (electronics); transients; voltage measurement; SET pulse width measurement; detection inverter; inverter chains; propagating voltage transients width measurement; pulsed laser irradiation; single event transient; supply current measurement; Current measurement; Inverters; Measurement by laser beam; Oscilloscopes; Transient analysis; Transistors; Voltage measurement; SET width; Single Event Transient; chains of inverters; pulsed laser irradiation;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
Print_ISBN :
978-1-4577-0481-9
DOI :
10.1109/RADECS.2008.5782706
