Title :
SEU rates in atmospheric environments: Variations due to cross-section fits and environment models
Author :
Hands, A. ; Dyer, C.S. ; Lei, F.
Author_Institution :
Aerosp. Div., QinetiQ, Farnborough, UK
Abstract :
The wide range in predicted SEU rates in avionics devices is analysed in relation to fitted device cross-section curves (including thermal neutron sensitivity) and the variation between atmospheric radiation models and current standards.
Keywords :
SRAM chips; atmospheric radiation; avionics; SEU rates; atmospheric environments; atmospheric radiation; avionics devices; cross-section fits; environment models; fitted device cross-section curves; single event upset; thermal neutron sensitivity; Aerospace electronics; Atmospheric measurements; Atmospheric modeling; Neutrons; Single event upset; Standards; Uncertainty; Single event upsets; atmospheric radiation models and standards; neutron cross-sections;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
Print_ISBN :
978-1-4577-0481-9
DOI :
10.1109/RADECS.2008.5782708
