DocumentCode
3365662
Title
Backscatter modified Mueller matrix elements from layered stratified medium
Author
Bahar, E. ; Kubik, R.D.
Author_Institution
Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
Volume
3
fYear
1994
fDate
20-24 June 1994
Firstpage
1630
Abstract
Backscatter specific intensities for irregular stratified structures consisting of three media are presented. They are expressed in terms of the modified Mueller (phase) matrix. The modified Mueller matrix relates the scattered (modified) Stokes vector to the incident (modified) Stokes vector. We consider the case in which the uppermost interface (facing the source) is a random rough surface. In addition to scattering and depolarization upon reflection, the incident wave also undergoes scattering and depolarization upon transmission across the rough interface. For isotropic surfaces six independent backscatter Mueller matrix elements are presented as functions of the incident angle with different roughness parameters. These modified Mueller matrix elements can be used to select the optimum backscatter angle and the wavelength that could be used to remotely detect the presence of coating materials deposited upon flat substrates.
Keywords
backscatter; electromagnetic wave polarisation; electromagnetic wave reflection; electromagnetic wave scattering; electromagnetic wave transmission; matrix algebra; EM wave scattering; backscatter specific intensities; coating materials; depolarization; flat substrates; incident Stokes vector; incident angle; incident wave; irregular stratified structures; isotropic surfaces; layered stratified medium; modified Mueller matrix elements; modified Stokes vector; multilayered media; optimum backscatter angle; optimum wavelength; phase matrix; random rough surface; reflection; roughness parameters; scattered Stokes vector; transmission; Attenuation; Backscatter; Coatings; Electromagnetic fields; Electromagnetic scattering; Electromagnetic wave absorption; Electromagnetic wave polarization; Rough surfaces; Surface roughness; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location
Seattle, WA, USA
Print_ISBN
0-7803-2009-3
Type
conf
DOI
10.1109/APS.1994.408139
Filename
408139
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