• DocumentCode
    3365662
  • Title

    Backscatter modified Mueller matrix elements from layered stratified medium

  • Author

    Bahar, E. ; Kubik, R.D.

  • Author_Institution
    Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
  • Volume
    3
  • fYear
    1994
  • fDate
    20-24 June 1994
  • Firstpage
    1630
  • Abstract
    Backscatter specific intensities for irregular stratified structures consisting of three media are presented. They are expressed in terms of the modified Mueller (phase) matrix. The modified Mueller matrix relates the scattered (modified) Stokes vector to the incident (modified) Stokes vector. We consider the case in which the uppermost interface (facing the source) is a random rough surface. In addition to scattering and depolarization upon reflection, the incident wave also undergoes scattering and depolarization upon transmission across the rough interface. For isotropic surfaces six independent backscatter Mueller matrix elements are presented as functions of the incident angle with different roughness parameters. These modified Mueller matrix elements can be used to select the optimum backscatter angle and the wavelength that could be used to remotely detect the presence of coating materials deposited upon flat substrates.
  • Keywords
    backscatter; electromagnetic wave polarisation; electromagnetic wave reflection; electromagnetic wave scattering; electromagnetic wave transmission; matrix algebra; EM wave scattering; backscatter specific intensities; coating materials; depolarization; flat substrates; incident Stokes vector; incident angle; incident wave; irregular stratified structures; isotropic surfaces; layered stratified medium; modified Mueller matrix elements; modified Stokes vector; multilayered media; optimum backscatter angle; optimum wavelength; phase matrix; random rough surface; reflection; roughness parameters; scattered Stokes vector; transmission; Attenuation; Backscatter; Coatings; Electromagnetic fields; Electromagnetic scattering; Electromagnetic wave absorption; Electromagnetic wave polarization; Rough surfaces; Surface roughness; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
  • Conference_Location
    Seattle, WA, USA
  • Print_ISBN
    0-7803-2009-3
  • Type

    conf

  • DOI
    10.1109/APS.1994.408139
  • Filename
    408139