DocumentCode :
3365662
Title :
Backscatter modified Mueller matrix elements from layered stratified medium
Author :
Bahar, E. ; Kubik, R.D.
Author_Institution :
Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
Volume :
3
fYear :
1994
fDate :
20-24 June 1994
Firstpage :
1630
Abstract :
Backscatter specific intensities for irregular stratified structures consisting of three media are presented. They are expressed in terms of the modified Mueller (phase) matrix. The modified Mueller matrix relates the scattered (modified) Stokes vector to the incident (modified) Stokes vector. We consider the case in which the uppermost interface (facing the source) is a random rough surface. In addition to scattering and depolarization upon reflection, the incident wave also undergoes scattering and depolarization upon transmission across the rough interface. For isotropic surfaces six independent backscatter Mueller matrix elements are presented as functions of the incident angle with different roughness parameters. These modified Mueller matrix elements can be used to select the optimum backscatter angle and the wavelength that could be used to remotely detect the presence of coating materials deposited upon flat substrates.
Keywords :
backscatter; electromagnetic wave polarisation; electromagnetic wave reflection; electromagnetic wave scattering; electromagnetic wave transmission; matrix algebra; EM wave scattering; backscatter specific intensities; coating materials; depolarization; flat substrates; incident Stokes vector; incident angle; incident wave; irregular stratified structures; isotropic surfaces; layered stratified medium; modified Mueller matrix elements; modified Stokes vector; multilayered media; optimum backscatter angle; optimum wavelength; phase matrix; random rough surface; reflection; roughness parameters; scattered Stokes vector; transmission; Attenuation; Backscatter; Coatings; Electromagnetic fields; Electromagnetic scattering; Electromagnetic wave absorption; Electromagnetic wave polarization; Rough surfaces; Surface roughness; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-2009-3
Type :
conf
DOI :
10.1109/APS.1994.408139
Filename :
408139
Link To Document :
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