Title :
Modeling the effects of broadening and degradation of single event transient pulses in integrated circuits
Author :
Ribeiro, Ivandro ; Wirth, Gilson ; Kastensmidt, Fernanda Lima
Author_Institution :
Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Abstract :
We compare the behavior of transient pulse propagation from laser testing presented in with electrical simulations, and present an analytical model that considers SET broadening and degradation in integrated circuits.
Keywords :
integrated circuit testing; radiation effects; SET broadening; SET degradation; analytical model; electrical simulation; integrated circuits; laser testing; single event transient pulses; transient pulse propagation; Analytical models; Integrated circuit modeling; Inverters; Load modeling; Logic gates; Mathematical model; Transient analysis; SET propagation modeling; Single Event Transient; fault injection;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
Print_ISBN :
978-1-4577-0481-9
DOI :
10.1109/RADECS.2008.5782710
