Sensitivities analysis of the current mirrors with MOS-FET for the basic FUZZY logic gates/circuits

Author

Sofron, Emil

Author_Institution

Dept. of Electron. & Comput., Univ. of Pitesti, Pitesti, Romania

fYear

2010

fDate

23-26 Sept. 2010

Firstpage

161

Lastpage

166

Abstract

The paper presents a comprehensive approach of the fuzzy logic gates/circuits from both technological and circuit analysis point of view, using SPICE simulation, based on computing the sensitivities of current mirrors with n and p-channel MOS-FET (using units or tens microns for L and W parameters). CMOS technology has been recognized as the technology for implementing fuzzy logic gates/circuits in the current mode, which offers a high versatility for different fuzzy logic operations, low power dissipation and high integration density. The basic units of fuzzy logic gates/circuits are the current mirrors with single and/or multiple outputs, usually designed and fabricated in 5-10 microns CMOS technology.

Keywords

CMOS logic circuits; SPICE; current mirrors; fuzzy logic; logic circuits; logic gates; CMOS technology; SPICE; circuit analysis; current mirrors; fuzzy logic circuits; fuzzy logic gates; n-channel MOSFET; p-channel MOSFET; size 5 mum to 10 mum; technological analysis; CMOS integrated circuits; Fuzzy logic; Integrated circuit modeling; Logic gates; Mirrors; Semiconductor device modeling; Transistors; SPICE simulation; current sources/mirrors; fuzzy logic gates/circuits; sensitivities;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Technology in Electronic Packaging (SIITME), 2010 IEEE 16th International Symposium for

Conference_Location

Pitesti

Print_ISBN

978-1-4244-8123-1

Type

conf

DOI

10.1109/SIITME.2010.5653501

Filename

5653501