Title :
Sensitivities analysis of the current mirrors with MOS-FET for the basic FUZZY logic gates/circuits
Author_Institution :
Dept. of Electron. & Comput., Univ. of Pitesti, Pitesti, Romania
Abstract :
The paper presents a comprehensive approach of the fuzzy logic gates/circuits from both technological and circuit analysis point of view, using SPICE simulation, based on computing the sensitivities of current mirrors with n and p-channel MOS-FET (using units or tens microns for L and W parameters). CMOS technology has been recognized as the technology for implementing fuzzy logic gates/circuits in the current mode, which offers a high versatility for different fuzzy logic operations, low power dissipation and high integration density. The basic units of fuzzy logic gates/circuits are the current mirrors with single and/or multiple outputs, usually designed and fabricated in 5-10 microns CMOS technology.
Keywords :
CMOS logic circuits; SPICE; current mirrors; fuzzy logic; logic circuits; logic gates; CMOS technology; SPICE; circuit analysis; current mirrors; fuzzy logic circuits; fuzzy logic gates; n-channel MOSFET; p-channel MOSFET; size 5 mum to 10 mum; technological analysis; CMOS integrated circuits; Fuzzy logic; Integrated circuit modeling; Logic gates; Mirrors; Semiconductor device modeling; Transistors; SPICE simulation; current sources/mirrors; fuzzy logic gates/circuits; sensitivities;
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2010 IEEE 16th International Symposium for
Conference_Location :
Pitesti
Print_ISBN :
978-1-4244-8123-1
DOI :
10.1109/SIITME.2010.5653501
