DocumentCode :
3365799
Title :
3-D simulation analysis of bipolar amplification in Planar Double-Gate and FinFET with independent gates
Author :
Munteanu, Daniela ; Autran, Jean-Luc ; Moreau, Mathieu
Author_Institution :
IM2NP, CNRS, Marseille, France
fYear :
2008
fDate :
10-12 Sept. 2008
Firstpage :
280
Lastpage :
283
Abstract :
The bipolar amplification and charge collection of Planar Double-Gate and FinFET with independent gates is simulated. The transient response of independent gate devices is compared to that of conventional devices having the gates tied together.
Keywords :
MOSFET; semiconductor device models; transient response; 3D simulation analysis; FinFET; bipolar amplification; charge collection; independent gate devices; planar double-gate; transient response; FinFETs; Logic gates; Numerical models; Radiation effects; Silicon; Three dimensional displays; Transient analysis; Double-Gate; FinFET; bipolar amplification; charge collection; heavy ion; independent gates; single event transient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0481-9
Type :
conf
DOI :
10.1109/RADECS.2008.5782727
Filename :
5782727
Link To Document :
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