Title :
Energy storage properties of BNT-BT based solid solution
Author :
Qi Xu ; Hanxing Liu ; Lin Zhang ; Minghe Cao ; Juan Xie ; Hua Hao ; Zhonghua Yao
Author_Institution :
State Key Lab. of Adv. Technol. for Mater. Synthesis & Process., Wuhan Univ. of Technol., Wuhan, China
Abstract :
The phase structure, microstructure, dielectric and energy storage properties of 0.85(0.92Bi0.5Na0.5TiO3-0.08BaTiO3)-0.15(Na1-3xBixNbO3) (BNTBT-NBxN) polycrystalline lead-free ceramics were systematically investigated. Dense and pore-free samples were prepared by conventional solid state reaction method. X-ray diffraction results indicated that the solid solubility of Bi in BNTBT-NBxN system lay at x=0.05~0.07. Within the solid solubility, the first dielectric anomaly which located at temperature Ts was depressed and shifted towards lower temperature with x increasing. As a consequence, the temperature stability of dielectric properties was largely improved, which demonstrated that BNTBT-NBxN ceramics were promising for high-temperature capacitor dielectrics. The ferroelectric properties analysis indicated that with the increase of x, the maximum polarization Pm gradually reduced and the P-E loops became slant and slim. The optimum energy storage properties was obtained for x=0.05 with energy storage density W=1.29J/cm3 and energy storage efficiency η=76%.
Keywords :
X-ray diffraction; barium compounds; bismuth compounds; ceramics; energy storage; sodium compounds; solid solubility; solid solutions; (Bi0.5Na0.5TiO3-BaTiO3)-(Na1-3xBixNbO3); X-ray diffraction; energy storage; first dielectric anomaly; high temperature capacitor dielectrics; maximum polarization; microstructure; phase structure; polycrystalline lead free ceramics; solid solubility; solid solution; Bismuth; Ceramics; Dielectrics; Energy storage; Lead; Solids; Temperature; Bi0.5Na0.5TiO3-BaTiO3; dielectric properties; energy storage density; energy storage efficiency;
Conference_Titel :
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location :
Singapore
DOI :
10.1109/ISAF.2015.7172675