• DocumentCode
    3365920
  • Title

    Bicoherence of EEG can be used to differentiate anesthetic levels

  • Author

    Watt, Richard C. ; Sisemore, Chris ; Kanemoto, Ansel ; Polson, J. Scott

  • Author_Institution
    Dept. of Anesthesiology, Arizona Univ., Tucson, AZ, USA
  • Volume
    5
  • fYear
    1996
  • fDate
    31 Oct-3 Nov 1996
  • Firstpage
    2035
  • Abstract
    Incidents of intra-operative awareness can result in severe, long-lasting post-traumatic distress syndrome. Fine tuning “depth of anesthesia” is clearly a desirable objective to prevent underdosing and overdosing. Various EEG derived variables have been used toward this objective with some success, and recent advances in computer technology have made bispectral analysis feasible for implementation in a real-time clinical monitor. Bispectral analysis is a sophisticated tool (capable of detecting inter-frequency phase-coherence) which the authors have applied to characterization of the EEG during anesthesia. In this study artificial neural networks (ANN) were used with bispectral analysis patterns for classification of EEG during propofol anesthesia with intentional “awareness incidents.”
  • Keywords
    electroencephalography; medical signal processing; neural nets; patient monitoring; spectral analysis; surgery; EEG bicoherence; EEG derived variables; anesthesia depth fine tuning; anesthetic levels differentiation; bispectral analysis; intentional awareness incidents; inter-frequency phase-coherence detection; intraoperative awareness; overdosing; propofol anesthesia; real-time clinical monitor; severe long-lasting post-traumatic distress syndrome; underdosing; Anesthesia; Anesthetic drugs; Artificial neural networks; Electroencephalography; Frequency; Pattern analysis; Pattern recognition; Phase measurement; Spectral analysis; Surgery;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-3811-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.1996.646415
  • Filename
    646415