Title :
Cryogenic characterization of ferroelectric materials
Author :
Pagoda, C.J. ; Mulvihill, M.L. ; Pilgrim, S.M.
Author_Institution :
New York State Coll. of Ceramics, Alfred Univ., NY, USA
Abstract :
The electronic cryogenic characterization chamber at the New York State College of Ceramics (NYSCC) at Alfred University is capable of measuring impedance, capacitance, and inductance, from room temperature down to ~15 K. Relative permittivity and loss of 29 compositions produced by Xinetics Inc. were measured to evaluate their dielectric performance at cryogenic temperatures. Capabilities of the cryogenic testing facility at the NYSCC and applications of ferroelectric materials at cryogenic temperatures are discussed
Keywords :
capacitance measurement; dielectric loss measurement; electric impedance measurement; ferroelectric materials; inductance measurement; low-temperature techniques; permittivity; permittivity measurement; 15 to 300 K; capacitance; cryogenic testing facility; dielectric loss; dielectric performance; electronic cryogenic characterization chamber; ferroelectric materials; impedance; inductance; permittivity; Capacitance measurement; Cryogenics; Dielectric loss measurement; Dielectric measurements; Ferroelectric materials; Impedance measurement; Inductance measurement; Loss measurement; Permittivity measurement; Temperature;
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-5940-2
DOI :
10.1109/ISAF.2000.942500
