DocumentCode
3366065
Title
Laser simulation of SEE due to localized ionization in dielectric structures
Author
Chugg, Andrew M. ; English, Roger ; Parker, Sarah ; Burnell, Andrew J.
Author_Institution
MBDA UK Ltd., Bristol, UK
fYear
2008
fDate
10-12 Sept. 2008
Firstpage
381
Lastpage
385
Abstract
This paper reports an investigation of the use of Two-Photon Absorption (TPA) of blue laser pulses and production of ultraviolet pulses through Second Harmonic Generation (SHG) to simulate single event effects involving ionization and charge trapping in dielectrics.
Keywords
harmonic generation; ionisation; radiation effects; two-photon spectroscopy; SEE; blue laser pulses; charge trapping; dielectric structures; laser simulation; localized ionization; second harmonic generation; single event effects; two-photon absorption; ultraviolet pulses; Absorption; Dielectrics; Discharges; Ionization; Microchip lasers; Photonics;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location
Jyvaskyla
ISSN
0379-6566
Print_ISBN
978-1-4577-0481-9
Type
conf
DOI
10.1109/RADECS.2008.5782748
Filename
5782748
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