• DocumentCode
    3366077
  • Title

    A low forward drop high voltage trench MOS barrier Schottky rectifier with linearly graded doping profile

  • Author

    Mahalingam, Srikanth ; Baliga, B.Jayant

  • Author_Institution
    North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1998
  • fDate
    3-6 Jun 1998
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    A novel high voltage Schottky rectifier, called the graded doped trench MOS barrier Schottky (GD-TMBS) rectifier, is described in this paper. A linearly graded drift region doping profile is shown to result in a uniform electric field in the drift region, resulting in the ability to support blocking voltages proportional to the trench depth. Two-dimensional device simulations have shown that breakdown voltages of up to 200 V can be achieved with a very low forward drop of 0.54 V. The measured on-state drop of fabricated 60 V and 100 V GD-TMBS are about 30% less than those of conventional Schottky rectifiers. The reverse leakage currents of the GD-TMBS rectifiers are two orders of magnitude less when compared to the conventional Schottky barrier diode
  • Keywords
    MIS structures; Schottky barriers; Schottky diodes; doping profiles; isolation technology; leakage currents; power semiconductor diodes; semiconductor device models; solid-state rectifiers; 0.54 V; 100 V; 200 V; 2D device simulations; 60 V; GD-TMBS rectifier; Schottky barrier diode; Schottky rectifiers; blocking voltages; breakdown voltages; forward drop; graded doped trench MOS barrier Schottky rectifier; high voltage Schottky rectifier; high voltage trench MOS barrier Schottky rectifier; linearly graded doping profile; linearly graded drift region doping profile; on-state drop; reverse leakage currents; trench depth; uniform drift region electric field; Doping profiles; Leakage current; Poisson equations; Rectifiers; Schottky barriers; Schottky diodes; Semiconductor device doping; Semiconductor diodes; Substrates; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
  • Conference_Location
    Kyoto
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-4752-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1998.702665
  • Filename
    702665