Title :
A technique to calculate the MBU distribution of a memory under radiation suffering the event accumulation problem
Author :
Reviriego, Pedro ; Maestro, Juan Antonio
Author_Institution :
Univ. Antonio de Nebrija, Madrid, Spain
Abstract :
When radiating memories, SEUs/MBUs tend to accumulate, making difficult to characterize the number of events and error patterns that have affected the system. A technique to deal with this problem is presented in this paper.
Keywords :
integrated circuits; radiation hardening (electronics); semiconductor storage; MBU distribution; error patterns; memory under radiation; multiple beat upsets; Multiple Bit Upsets (MBUs); memories; reliability;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
Print_ISBN :
978-1-4577-0481-9
DOI :
10.1109/RADECS.2008.5782750
