• DocumentCode
    3366096
  • Title

    A technique to calculate the MBU distribution of a memory under radiation suffering the event accumulation problem

  • Author

    Reviriego, Pedro ; Maestro, Juan Antonio

  • Author_Institution
    Univ. Antonio de Nebrija, Madrid, Spain
  • fYear
    2008
  • fDate
    10-12 Sept. 2008
  • Firstpage
    393
  • Lastpage
    396
  • Abstract
    When radiating memories, SEUs/MBUs tend to accumulate, making difficult to characterize the number of events and error patterns that have affected the system. A technique to deal with this problem is presented in this paper.
  • Keywords
    integrated circuits; radiation hardening (electronics); semiconductor storage; MBU distribution; error patterns; memory under radiation; multiple beat upsets; Multiple Bit Upsets (MBUs); memories; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
  • Conference_Location
    Jyvaskyla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0481-9
  • Type

    conf

  • DOI
    10.1109/RADECS.2008.5782750
  • Filename
    5782750
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3366096