Title :
Texture Analysis in Polarimetric Sar Using the Covariance Matrix
Author :
Mancini, P. ; Griffiths, H.D.
Author_Institution :
European Space Agency, ESTEC (XRI), The Netherlands
Keywords :
Covariance matrix; Eigenvalues and eigenfunctions; Layout; Pixel; Rough surfaces; Scattering; Speckle; Surface roughness; Symmetric matrices; Synthetic aperture radar;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1992. IGARSS '92. International
Conference_Location :
Houston, TX, USA
Print_ISBN :
0-7803-0138-2
DOI :
10.1109/IGARSS.1992.578289
