DocumentCode :
3366616
Title :
Application of logistic regression for fault analysis in an industrial printing process
Author :
Sutanto, E. ; Warwick, K. ; Griffin, M.
Author_Institution :
Dept. of Cybern., Reading Univ., UK
fYear :
1992
fDate :
12-14 May 1992
Firstpage :
675
Lastpage :
680
Abstract :
A statistical technique for fault analysis in industrial printing is reported. The method specifically deals with binary data, for which the results of the production process fall into two categories, rejected or accepted. The method is referred to as logistic regression, and is capable of predicting future fault occurrences by the analysis of current measurements from machine parts sensors. Individual analysis of each type of fault can determine which parts of the plant have a significant influence on the occurrence of such faults; it is also possible to infer which measurable process parameters have no significant influence on the generation of these faults. Information derived from the analysis can be helpful in the operator´s interpretation of the current state of the plant. Appropriate actions may then be taken to prevent potential faults from occurring. The algorithm is being implemented as part of an applied self-learning expert system
Keywords :
expert systems; fault location; learning (artificial intelligence); printing industry; statistical analysis; binary data; fault analysis; fault occurrences; industrial printing; logistic regression; machine parts sensors; prediction; production process; self-learning expert system; statistical technique; Color; Current measurement; Cybernetics; Expert systems; Information analysis; Knowledge based systems; Logistics; Medical expert systems; Printing; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
Type :
conf
DOI :
10.1109/IMTC.1992.245054
Filename :
245054
Link To Document :
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