• DocumentCode
    3366651
  • Title

    Function-based cost modeling for wafer manufacturing and its application to strategic management

  • Author

    Guo, Ruey-Shan ; Chen, Argon ; Lin, Pei-Lan ; Shih, Yih-Cheng

  • Author_Institution
    Dept. of Ind. Manage., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    31
  • Lastpage
    34
  • Abstract
    In this paper a function-based cost modeling methodology is proposed, which consists of three major steps: function analysis, cost modeling and strategic management. A system analysis technique IDEFO is used as the basis of function analysis. Function-based cost models are then constructed, and with which pie-chart analysis and sensitivity analysis provide managers important information for critical decision-making. A generic photolithography process is used as a test bed. Results show that IDEFO is an effective tool for modeling IC manufacturing processes and the manufacturing cost based on the proposed methodology is more easily and accurately calculated than the current practices
  • Keywords
    costing; integrated circuit economics; photolithography; semiconductor process modelling; sensitivity analysis; strategic planning; IC manufacturing; IDEFO; cost modeling; decision making; function analysis; photolithography; pie chart; semiconductor wafer manufacturing; sensitivity analysis; strategic management; system analysis; Cost function; Decision making; Information analysis; Information management; Integrated circuit modeling; Lithography; Manufacturing processes; Semiconductor device modeling; Sensitivity analysis; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-5403-6
  • Type

    conf

  • DOI
    10.1109/ISSM.1999.808731
  • Filename
    808731