DocumentCode :
3366769
Title :
Neural processing-type fiber-optic strain sensor
Author :
Bock, Wojtek J. ; Porada, Eugeniusz ; Zaremba, Marek B.
Author_Institution :
Dept. d´´Inf., Quebec Univ., Hull, Que., Canada
fYear :
1992
fDate :
12-14 May 1992
Firstpage :
635
Lastpage :
639
Abstract :
The authors present a neural-processing-type strain sensor insensitive to thermal variation and describe calibration of the device through modulation of the internal parameters of the processing system. The sensor exploits the variation of the far-field polarization pattern in a single-mode birefringent fiber under the influence of longitudinal strain. A temperature-compensating fiber element is built in, making the sensor assembly immune to thermal variation. Sampling of the sensor output and parallel distributed processing of the samples are integrated with the sensor. The processor contains both a training function and a generalization function. The training function modulates a small linear network built into the system. In the working phase, the generalization function is used to recover the measurement information. Provided the sensor is thermally compensated, the network gives the reading of the measurand with an error not exceeding 0.1%
Keywords :
birefringence; calibration; compensation; distributed processing; fibre optic sensors; image processing; learning (artificial intelligence); light polarisation; neural nets; strain measurement; calibration; far-field polarization pattern; fiber-optic strain sensor; generalization function; longitudinal strain; modulation; neural nets; parallel distributed processing; single-mode birefringent fiber; temperature-compensating fiber element; thermal compensation; thermal variation; training function; Birefringence; Calibration; Capacitive sensors; Optical fiber devices; Optical fiber polarization; Optical fiber sensors; Sensor phenomena and characterization; Sensor systems; Temperature sensors; Thermal sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
Type :
conf
DOI :
10.1109/IMTC.1992.245061
Filename :
245061
Link To Document :
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