• DocumentCode
    3366924
  • Title

    Spline-based LMS method with constraints for spectrophotometric data correction

  • Author

    Ben Slima, Mohamed ; Morawski, Roman Z. ; Barwicz, Andrzej

  • Author_Institution
    Dept. d´´Ingeniere, Quebec Univ., Trois-Rivieres, Que., Canada
  • fYear
    1992
  • fDate
    12-14 May 1992
  • Firstpage
    594
  • Lastpage
    597
  • Abstract
    The results of spectrophotometric measurements are subject to systematic errors of instrumental type which may be partially corrected provided a mathematical model of the instrumental imperfections is identified. It is assumed that this model has the form of an integral, convolution-type equation of the first kind. The correction of the results of measurements subject to random measurement errors consists in the numerical solution of this equation on the basis of these results. An algorithm of correction is proposed. It is based on the approximation of the solution with a spline function whose parameters are determined using the least-mean square (LMS) method with two constraints of the set of feasible solutions. The efficiency of the incorporation of these constraints into the algorithm of correction is demonstrated using synthetic data. The possibility of improving resolution of spectrometric measurements is shown using specially acquired sets of spectrometric data
  • Keywords
    least squares approximations; measurement errors; numerical analysis; random processes; spectrophotometry; splines (mathematics); LMS method; integral convolution equation; least mean square method; mathematical model; numerical solution; random measurement errors; spectrophotometric data correction; spectrophotometric measurements; spline function; synthetic data; systematic errors; Absorption; Error correction; Instruments; Integral equations; Least squares approximation; Mathematical model; Measurement errors; Optical recording; Spectroscopy; Spline;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
  • Conference_Location
    Metropolitan, NY
  • Print_ISBN
    0-7803-0640-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1992.245070
  • Filename
    245070