Title :
Application of second generation infrared imaging with computerized image analysis to breast cancer risk assessment
Author :
Head, Jonathan F. ; Lipari, Charles A. ; Wang, Fen ; Davidson, James E. ; Elliott, Robert L.
Author_Institution :
Med. Thermal Diagnostics, LBTC, Baton Rouge, LA, USA
fDate :
31 Oct-3 Nov 1996
Abstract :
Infrared imaging of the breast for breast cancer risk assessment with a second generation focal plane staring array system was found to produce images superior to a first generation scanning system. The second generation system had greater thermal sensitivity, more elements in the image and greater dynamic range, which resulted in a greater ability to demonstrate asymmetric heat patterns in the breasts of women being screened for breast cancer. The improved imaging of the second generation infrared system allowed more objective and quantitative visual analysis, compared to the very subjective qualitative results of the first generation infrared system. The greater sensitivity and resolution of the digitized images of the second generation infrared system also allowed image analysis of total breasts, breast quadrants and hot spots to produce mean, standard deviation, median, minimum and maximum temperatures
Keywords :
biothermics; image resolution; infrared imaging; medical image processing; asymmetric heat patterns; breast cancer risk assessment; breast quadrants; computerized image analysis; digitized images; first generation scanning system; hot spots; image dynamic range; image elements; maximum temperature; medical diagnostic imaging; minimum temperature; quantitative visual analysis; second generation infrared imaging; subjective qualitative results; thermal sensitivity; women; Application software; Breast cancer; Dynamic range; Image analysis; Image resolution; Infrared imaging; Optical computing; Optical imaging; Risk management; Temperature sensors;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.646448