Title :
Prototype fiber-optic pressure cell for stress monitoring
Author :
Bock, Wojtek J. ; Voet, Marc R H ; Beaulieu, Mario ; Wolinski, Tomasz R. ; Chen, Jiahua
Author_Institution :
Dept. d´´Inf., Quebec Univ., Hull, Que., Canada
Abstract :
A fiber-optic pressure cell (FOPC) device is presented for measurement of real stress in the construction and mining industries. The device is miniature, completely electromagnetic-interference (EMI) -free and directly compatible with optical data transmission systems. The sensing element of the device is based on a highly birefringent (HB) polarization-maintaining optical fiber. The instrumentation of the sensor consists of an HeNe linearly polarized laser, polarization controllers, input and output optical fibers, an analyzer, and a computer-controlled synchronous detection system based on a lock-in amplifier. An all-fiber configuration employing a semiconductor pigtailed laser without any bulk optical components was developed and studied. For calibration purposes, the pressure cell was placed inside a large pressure chamber designed to simulate the real environment. The chamber was connected to a Harwood deadweight tester with an attainable accuracy of 0.01%. The device hysteresis, selectivity, and sensitivity, were determined for pressures up to 70 bar and for ambient temperature
Keywords :
fibre optic sensors; measurement by laser beam; pressure sensors; stress measurement; 70 bar; Harwood deadweight tester; HeNe linearly polarized laser; analyzer; birefringent fiber; calibration; computer-controlled synchronous detection; construction industry; fiber-optic pressure cell; gas lasers; hysteresis; lock-in amplifier; mining industries; polarization controllers; polarization-maintaining optical fiber; prototype; selectivity; semiconductor pigtailed laser; sensitivity; stress monitoring; Electromagnetic wave polarization; Fiber lasers; Monitoring; Optical devices; Optical fiber devices; Optical fiber polarization; Optical sensors; Prototypes; Semiconductor lasers; Stress;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
DOI :
10.1109/IMTC.1992.245093