• DocumentCode
    3367332
  • Title

    A wide-range logarithmic electrometer with improved accuracy and temperature stability

  • Author

    Ericson, M.N. ; Falter, K.G. ; Rochelle, J.M.

  • Author_Institution
    Oak Ridge Nat. Lab., TN, USA
  • fYear
    1992
  • fDate
    12-14 May 1992
  • Firstpage
    454
  • Lastpage
    459
  • Abstract
    A seven-decade temperature-compensated logarithmic electrometer is presented. Temperature compensation is achieved by using an array of four matched monolithic bipolar transistors and straightforward postprocessing techniques. Use of this method results in <1% error over the temperature range of -18 to 71°C for the upper five decades of current. Errors resulting from variable forward current emission coefficients of the logarithmic elements are eliminated. Problems associated with the temperature compensation of logarithmic amplifiers are identified and discussed. Conventional temperature-compensation techniques and associated errors are reviewed. The implementation of the new temperature-compensation technique is described and compared with conventional methods. Sources of errors are identified, and error minimization procedures are presented. Experimental results and data analysis illustrating the performance of the design are given
  • Keywords
    compensation; data analysis; electrometers; measurement errors; signal processing equipment; -18 to 71 degC; accuracy; atmospheric radiation measurement; data analysis; error minimization; logarithmic amplifiers; matched monolithic bipolar transistors; postprocessing; temperature compensation; temperature stability; temperature-compensated logarithmic electrometer; wide-range logarithmic electrometer; Bipolar transistors; Circuits; Dielectric substrates; Error correction; Leakage current; Operational amplifiers; Semiconductor process modeling; Stability; Temperature distribution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
  • Conference_Location
    Metropolitan, NY
  • Print_ISBN
    0-7803-0640-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1992.245097
  • Filename
    245097