Title :
A custom integrated circuit comparator for high-performance sampling applications
Author :
Laug, Owen B. ; Souders, T. Michael ; Flach, Donald R.
Author_Institution :
Nat. Inst. of Stand.& Technol., Gaithersburg, MD, USA
Abstract :
The design and performance of an application specific integrated circuit (ASIC) comparator that has been optimized for equivalent-time waveform sampling applications is reported. The comparator, which has been fabricated with an 8.5-GHz fT, bipolar silicon process, features a bandwidth of >2 GHz, a settling-time accuracy of 0.1% in 2 ns, and almost total elimination of thermal tails in the settling response. The design has eliminated thermal effects, common in other comparators, than can cause errors and affect the voltage settling time. The comparator can be used in a sampling system for both frequency domain measurements, e.g., wideband RMS voltage measurements, and high accuracy time domain pulse measurements
Keywords :
analogue-digital conversion; application specific integrated circuits; bipolar integrated circuits; comparators (circuits); signal processing equipment; voltage measurement; 2 GHz; 8.5 GHz; A/D convertor; ASIC; Si; application specific integrated circuit; bipolar silicon process; custom integrated circuit comparator; equivalent-time waveform sampling; errors; frequency domain measurements; high-performance sampling; thermal tails; time domain pulse measurements; voltage settling time; wideband RMS voltage measurements; Application specific integrated circuits; Bandwidth; Design optimization; Frequency domain analysis; Frequency measurement; Pulse measurements; Sampling methods; Silicon; Tail; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
DOI :
10.1109/IMTC.1992.245101