DocumentCode
3367384
Title
A custom integrated circuit comparator for high-performance sampling applications
Author
Laug, Owen B. ; Souders, T. Michael ; Flach, Donald R.
Author_Institution
Nat. Inst. of Stand.& Technol., Gaithersburg, MD, USA
fYear
1992
fDate
12-14 May 1992
Firstpage
437
Lastpage
441
Abstract
The design and performance of an application specific integrated circuit (ASIC) comparator that has been optimized for equivalent-time waveform sampling applications is reported. The comparator, which has been fabricated with an 8.5-GHz f T, bipolar silicon process, features a bandwidth of >2 GHz, a settling-time accuracy of 0.1% in 2 ns, and almost total elimination of thermal tails in the settling response. The design has eliminated thermal effects, common in other comparators, than can cause errors and affect the voltage settling time. The comparator can be used in a sampling system for both frequency domain measurements, e.g., wideband RMS voltage measurements, and high accuracy time domain pulse measurements
Keywords
analogue-digital conversion; application specific integrated circuits; bipolar integrated circuits; comparators (circuits); signal processing equipment; voltage measurement; 2 GHz; 8.5 GHz; A/D convertor; ASIC; Si; application specific integrated circuit; bipolar silicon process; custom integrated circuit comparator; equivalent-time waveform sampling; errors; frequency domain measurements; high-performance sampling; thermal tails; time domain pulse measurements; voltage settling time; wideband RMS voltage measurements; Application specific integrated circuits; Bandwidth; Design optimization; Frequency domain analysis; Frequency measurement; Pulse measurements; Sampling methods; Silicon; Tail; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location
Metropolitan, NY
Print_ISBN
0-7803-0640-6
Type
conf
DOI
10.1109/IMTC.1992.245101
Filename
245101
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