DocumentCode :
3367415
Title :
Fault tolerance of SRAM-based FPGA via configuration frames
Author :
Lahrach, Farid ; Doumar, Abderrahim ; Châtelet, Eric
Author_Institution :
STMR, Univ. de Technol. de Troyes, Troyes, France
fYear :
2011
fDate :
13-15 April 2011
Firstpage :
139
Lastpage :
142
Abstract :
Fault tolerance is an important system metric to increase chip reliability. The conventional technique for improving system reliability is through component replication, which usually comes at significant cost: increased design time, testing, power consumption, volume and weight. In this contribution, we propose a technique based on partial dynamic reconfiguration (PDR) to tolerate faults in configurable logic blocks (CLBs) and routing resources (RRs). The fault tolerance is achieved through SRAM cells of configuration frames. Our method do not require preallocated spare CLBs or RRs. The reliability of frames is analyzed and improved.
Keywords :
SRAM chips; fault tolerance; field programmable gate arrays; integrated circuit reliability; logic design; logic testing; CLB; PDR; RR; SRAM-based FPGA; chip reliability; component replication; configurable logic blocks; configuration frames; fault tolerance; partial dynamic reconfiguration; routing resources; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Random access memory; Tiles; SRAM cells; SRAM-based FPGA; configuration frames; fault tolerance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location :
Cottbus
Print_ISBN :
978-1-4244-9755-3
Type :
conf
DOI :
10.1109/DDECS.2011.5783066
Filename :
5783066
Link To Document :
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