DocumentCode :
3367536
Title :
Functional enhancements of TMR for power efficient and error resilient ASIC designs
Author :
Sämrow, Hagen ; Cornelius, Claas ; Gorski, Philipp ; Salzmann, Jakob ; Tockhorn, Andreas ; Timmermann, Dirk
Author_Institution :
Dept. of Electr. Eng., Univ. of Rostock, Rostock, Germany
fYear :
2011
fDate :
13-15 April 2011
Firstpage :
183
Lastpage :
188
Abstract :
Progressive technology scaling raises the need for efficient VLSI design methods facing the increasing vulnerability to permanent physical defects, while considering power efficiency of resulting circuit implementations at the same time. Triple Modular Redundancy (TMR) represents a common method to encounter reliability problems, but has the drawback of increased area and power consumption. This work introduces a Low Power Redundant (LPR) design solution that targets the power penalty of TMR implementations. This is done by enhanced and new functional runtime capabilities for error detection and operation control. By exploiting the inherent modularity and parallelism of TMR, the LPR solution applies additional control logic to switch dynamically between compare phases (to indicate faults and their locations) and parallel operation (with reduced operation frequency). This allows power optimized circuit operation with full support for the treatment of permanent faults. Simulation results on different ALU implementations show a decrease of power consumption of up to 60% compared to conventional TMR. Furthermore, different strategies for the switching between operation modes are introduced that enable power efficient system operation in the presence of permanent physical defects. Moreover, significant reliability improvements are also achieved due to the adaptive use of the redundant modules.
Keywords :
application specific integrated circuits; integrated circuit design; integrated circuit reliability; logic design; redundancy; ALU; TMR; VLSI design method; error detection; error resilient ASIC design; low power redundant design solution; operation control; permanent physical defect; power efficient ASIC design; reliability problem; triple modular redundancy; Circuit faults; Delay; Delta modulation; Power demand; Reliability engineering; Tunneling magnetoresistance; Circuit Design; Power Consumption; Power-Aware Design; Reliability; Triple Modular Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location :
Cottbus
Print_ISBN :
978-1-4244-9755-3
Type :
conf
DOI :
10.1109/DDECS.2011.5783077
Filename :
5783077
Link To Document :
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