• DocumentCode
    3367704
  • Title

    Incorporating statistical process control into the team-based TPM environment

  • Author

    Conway, Tim ; Perry, Eric

  • Author_Institution
    Cypress Semicond., Bloomington, MN, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    281
  • Lastpage
    284
  • Abstract
    Total Productive Manufacturing (TPM) and Statistical Process Control (SPC) have similar objectives in that both strive to maintain optimal performance of processes and equipment. The effectiveness of both is also enhanced through the involvement of operators in cross-functional teams. Cypress Semiconductor is successfully integrating SPC into its TPM structure
  • Keywords
    integrated circuit manufacture; statistical process control; Cypress Semiconductor; cross-functional teams; statistical process control; team-based TPM environment; total productive manufacturing; Computer hacking; Large Hadron Collider; Manufacturing; Personnel; Process control; Productivity; Sampling methods; Semiconductor device manufacture; Signal processing; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-5403-6
  • Type

    conf

  • DOI
    10.1109/ISSM.1999.808790
  • Filename
    808790
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3367704