Title :
Incorporating statistical process control into the team-based TPM environment
Author :
Conway, Tim ; Perry, Eric
Author_Institution :
Cypress Semicond., Bloomington, MN, USA
Abstract :
Total Productive Manufacturing (TPM) and Statistical Process Control (SPC) have similar objectives in that both strive to maintain optimal performance of processes and equipment. The effectiveness of both is also enhanced through the involvement of operators in cross-functional teams. Cypress Semiconductor is successfully integrating SPC into its TPM structure
Keywords :
integrated circuit manufacture; statistical process control; Cypress Semiconductor; cross-functional teams; statistical process control; team-based TPM environment; total productive manufacturing; Computer hacking; Large Hadron Collider; Manufacturing; Personnel; Process control; Productivity; Sampling methods; Semiconductor device manufacture; Signal processing; USA Councils;
Conference_Titel :
Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-5403-6
DOI :
10.1109/ISSM.1999.808790
