DocumentCode
3367741
Title
Fabrication of InGaAs quantum wires with composition-controlled barrier layers by selective growth of molecular beam epitaxy
Author
Sugaya, Takeyoshi ; Nakagawa, Tadashi ; Sugiyama, Yoshinobu
Author_Institution
Electrotech. Lab., Tsukuba, Japan
fYear
1996
fDate
21-25 Apr 1996
Firstpage
93
Lastpage
96
Abstract
InGaAs quantum wire structures with composition-controlled InAlAs barrier layer have been fabricated on non-planar substrates by molecular beam epitaxy. The InAlAs barrier layer lattice-matched to InP on top of the truncated ridges is obtained by the control of the In flux during the growth, otherwise, the composition of InAlAs barrier layer deviates. The PL intensity of InGaAs quantum wires with composition-controlled InAlAs barrier layer is stronger than that of the wires without compositional control. This result indicates that the InGaAs quantum wire structures with good quality are fabricated by the compositional control of the InAlAs barrier layer
Keywords
aluminium compounds; gallium arsenide; indium compounds; interface structure; molecular beam epitaxial growth; photoluminescence; semiconductor growth; semiconductor quantum wires; spectral line intensity; In flux; InAlAs barrier layer; InGaAs quantum wire structures; InGaAs quantum wires; InGaAs-InAlAs; InP; PL intensity; composition; composition-controlled InAlAs barrier layer; composition-controlled barrier layers; compositional control; molecular beam epitaxy; nonplanar substrates; selective growth; truncated ridges; Epitaxial layers; Etching; Fabrication; Gallium arsenide; Indium compounds; Indium gallium arsenide; Indium phosphide; Molecular beam epitaxial growth; Substrates; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location
Schwabisch-Gmund
Print_ISBN
0-7803-3283-0
Type
conf
DOI
10.1109/ICIPRM.1996.491943
Filename
491943
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