Title :
Fabrication of InGaAs quantum wires with composition-controlled barrier layers by selective growth of molecular beam epitaxy
Author :
Sugaya, Takeyoshi ; Nakagawa, Tadashi ; Sugiyama, Yoshinobu
Author_Institution :
Electrotech. Lab., Tsukuba, Japan
Abstract :
InGaAs quantum wire structures with composition-controlled InAlAs barrier layer have been fabricated on non-planar substrates by molecular beam epitaxy. The InAlAs barrier layer lattice-matched to InP on top of the truncated ridges is obtained by the control of the In flux during the growth, otherwise, the composition of InAlAs barrier layer deviates. The PL intensity of InGaAs quantum wires with composition-controlled InAlAs barrier layer is stronger than that of the wires without compositional control. This result indicates that the InGaAs quantum wire structures with good quality are fabricated by the compositional control of the InAlAs barrier layer
Keywords :
aluminium compounds; gallium arsenide; indium compounds; interface structure; molecular beam epitaxial growth; photoluminescence; semiconductor growth; semiconductor quantum wires; spectral line intensity; In flux; InAlAs barrier layer; InGaAs quantum wire structures; InGaAs quantum wires; InGaAs-InAlAs; InP; PL intensity; composition; composition-controlled InAlAs barrier layer; composition-controlled barrier layers; compositional control; molecular beam epitaxy; nonplanar substrates; selective growth; truncated ridges; Epitaxial layers; Etching; Fabrication; Gallium arsenide; Indium compounds; Indium gallium arsenide; Indium phosphide; Molecular beam epitaxial growth; Substrates; Wires;
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
DOI :
10.1109/ICIPRM.1996.491943