DocumentCode :
3367772
Title :
Optoelectronical identification of glass characteristics
Author :
Hofmann, Dietrich ; Gassmann, Frank
Author_Institution :
Dept. of Meas. Eng. & Quality Assurance, Friedrich-Schiller-Univ. Jena, Germany
fYear :
1992
fDate :
12-14 May 1992
Firstpage :
356
Lastpage :
360
Abstract :
Selected algorithms and application problems connected with identification methods for glass strength behavior are reported. Contactless objective image processing procedures for smart metrical measurements of break cones within glass probes are described. Technologies for the modeling of mechanical edges by optical images and for statistical edge detection with pixel resolution are presented. Special emphasis is given to the explanation of differences between static and dynamic edge detections, as well as differences between measurements with pixel and subpixel resolutions
Keywords :
edge detection; fracture toughness; glass; image processing; nondestructive testing; tensile strength; break cones; dynamic edge detections; fracture resistance; glass characteristics; glass probes; glass strength; identification; mechanical edges; objective image processing; optical images; pixel resolution; smart metrical measurements; statistical edge detection; subpixel resolutions; Area measurement; Charge coupled devices; Charge-coupled image sensors; Glass; Image processing; Optical microscopy; Optical sensors; Probes; Sensor systems; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
Type :
conf
DOI :
10.1109/IMTC.1992.245118
Filename :
245118
Link To Document :
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