Title :
A variation-aware adaptive voltage scaling technique based on in-situ delay monitoring
Author :
Wirnshofer, Martin ; Heiss, Leonhard ; Georgakos, Georg ; Schmitt-Landsiedel, Doris
Author_Institution :
Inst. for Tech. Electron., Tech. Univ. Munchen, Munich, Germany
Abstract :
In this paper, we present an adaptive voltage scaling (AVS) scheme to tune the supply voltage of digital circuits according to variations. Compared to worst-case designs, which produce fixed and excessively large safety margins, a considerable amount of energy can be saved by this approach. The AVS technique is based on in-situ delay monitoring, i.e. observing the timing in critical paths. For this task, we propose a Pre-Error flip-flop, that is capable of detecting late data transitions - so-called pre-errors. We provide an in-depth analysis, that is based on a Markov model, to describe the closed loop voltage regulation. We simulated the power saving potential compared to the worst-case design and obtained a reduction of 13.5% in active energy for a negligible error rate of 1E-15. Moreover, we illustrate the opportunity to further reduce the power consumption when tolerating higher error rates. This way, our approach can gain the optimal power saving for a given allowed failure probability.
Keywords :
Markov processes; closed loop systems; computerised monitoring; digital circuits; error statistics; flip-flops; power aware computing; power consumption; probability; voltage control; AVS scheme; AVS technique; Markov model; active energy; closed loop voltage regulation; digital circuits; failure probability; in-depth analysis; in-situ delay monitoring; late data transitions; negligible error rate; power consumption; power saving potential; pre-error flip-flop; safety margins; supply voltage; variation-aware adaptive voltage scaling technique; worst-case designs; Clocks; Delay; Monitoring; Temperature measurement; Temperature sensors; Voltage control;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location :
Cottbus
Print_ISBN :
978-1-4244-9755-3
DOI :
10.1109/DDECS.2011.5783090