• DocumentCode
    3367910
  • Title

    Design of test and diagnosis system for FPGA circuit board based on functional modeling

  • Author

    Wang Cheng-gang ; Li Jian-hai ; Sun Jing ; Sun Yan-li

  • Author_Institution
    Sch. of Optoelectron., Beijing Inst. of Technol., Beijing, China
  • Volume
    7
  • fYear
    2011
  • fDate
    12-14 Aug. 2011
  • Firstpage
    3337
  • Lastpage
    3340
  • Abstract
    Circuit boards composed of the boundary scan and non-boundary scan devices exist widely, and the fault detection and isolation of these non-boundary scan circuit boards is a puzzle for board-level maintenance and testing. Test methods based on boundary scan and digital I/O can not fulfill functional testing of entire circuit board. An automatic test system is constructed and a functional modeling method is put forward for FPGA circuit board testing. First, VITAL model is generated in FPGA development environment, achieving its functional modeling; then VITAL format configuration files and data are imported into LASAR, realizing circuit board simulation and fault simulation, and generating postprocessing documents; finally, postprocessing documents are input into ATE, and the automated testing and fault diagnosis of FPGA circuit board is implemented.
  • Keywords
    field programmable gate arrays; printed circuit design; printed circuit testing; printed circuits; FPGA circuit board testing; FPGA development environment; LASAR; VITAL format configuration files; VITAL model; automatic test system; circuit board simulation; diagnosis system; fault simulation; functional modeling method; postprocessing documents; Application specific integrated circuits; Data models; Field programmable gate arrays; Integrated circuit modeling; Libraries; Printed circuits; Testing; ATE; FPGA; fault diagnosis; functional modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
  • Conference_Location
    Harbin, Heilongjiang
  • Print_ISBN
    978-1-61284-087-1
  • Type

    conf

  • DOI
    10.1109/EMEIT.2011.6023800
  • Filename
    6023800