Title :
Design of test and diagnosis system for FPGA circuit board based on functional modeling
Author :
Wang Cheng-gang ; Li Jian-hai ; Sun Jing ; Sun Yan-li
Author_Institution :
Sch. of Optoelectron., Beijing Inst. of Technol., Beijing, China
Abstract :
Circuit boards composed of the boundary scan and non-boundary scan devices exist widely, and the fault detection and isolation of these non-boundary scan circuit boards is a puzzle for board-level maintenance and testing. Test methods based on boundary scan and digital I/O can not fulfill functional testing of entire circuit board. An automatic test system is constructed and a functional modeling method is put forward for FPGA circuit board testing. First, VITAL model is generated in FPGA development environment, achieving its functional modeling; then VITAL format configuration files and data are imported into LASAR, realizing circuit board simulation and fault simulation, and generating postprocessing documents; finally, postprocessing documents are input into ATE, and the automated testing and fault diagnosis of FPGA circuit board is implemented.
Keywords :
field programmable gate arrays; printed circuit design; printed circuit testing; printed circuits; FPGA circuit board testing; FPGA development environment; LASAR; VITAL format configuration files; VITAL model; automatic test system; circuit board simulation; diagnosis system; fault simulation; functional modeling method; postprocessing documents; Application specific integrated circuits; Data models; Field programmable gate arrays; Integrated circuit modeling; Libraries; Printed circuits; Testing; ATE; FPGA; fault diagnosis; functional modeling;
Conference_Titel :
Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
Conference_Location :
Harbin, Heilongjiang
Print_ISBN :
978-1-61284-087-1
DOI :
10.1109/EMEIT.2011.6023800