• DocumentCode
    3368116
  • Title

    Thickness-dependent magnetotransport properties of La0.6Sr0.2Mn1.2O3 films on SrTiO3 and LaAlO3 substrates

  • Author

    Tovstolytkin, A. ; Polek, T. ; Matviyenko, A. ; Zakharenko, M. ; Semen´ko, M. ; Pashchenko, A.

  • fYear
    2012
  • fDate
    3-7 Sept. 2012
  • Firstpage
    270
  • Lastpage
    271
  • Abstract
    Electric and magnetoresistive properties of La0.6Sr0.2Mn1.2O3 films deposited on SrTiO3 (001) and LaAlO3 (001) single crystalline substrates by magnetron sputtering have been studied. Characteristic features of the evolution of resistivity, magnetoresistance and Curie temperature upon the decrease of film thickness from 500 to 12.5 nm are specified. A key role of a thin strained layer adjacent to the substrate is demonstrated. The critical thicknesses of the strained layer are calculated for the films deposited on different substrates.
  • Keywords
    Conductivity; Films; Magnetic properties; Magnetoresistance; Substrates; Temperature; Temperature measurement; Curie temperature; doped manganites; magnetoresistance; strained layer; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Oxide Materials for Electronic Engineering (OMEE), 2012 IEEE International Conference on
  • Conference_Location
    Lviv, Ukraine
  • Print_ISBN
    978-1-4673-4491-3
  • Type

    conf

  • DOI
    10.1109/OMEE.2012.6464771
  • Filename
    6464771