Behavior of CMOS polymorphic circuits in high temperature environment

The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (V_dd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by V_dd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.