Title :
Reliability of data acquisition instrumentation
Author :
Tianshu, Huang ; Qingzhen, Ren ; Chuanhua, Yang ; Quimin, X.
Author_Institution :
Wuhan Univ. of Hydraulic & Electri. Eng., Hubei, China
Abstract :
An analysis of the reliability of logic relations among the modules and units of a modular data acquisition system is presented. Remote modular systems, fault-tolerant construction, and mixed-redundancy systems are discussed. It is concluded that the modular system is fault tolerant, and that small and inexpensive modules and units make hardware redundancy available, which greatly increases system life
Keywords :
data acquisition; fault tolerant computing; redundancy; reliability; data acquisition instrumentation; fault-tolerant construction; logic relations; mixed-redundancy; modular data acquisition; reliability; remote modular system; system life; Data acquisition; Data engineering; Electronic components; Fault tolerant systems; Hardware; Instruments; Large-scale systems; Logic; Modular construction; Reliability engineering;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
DOI :
10.1109/IMTC.1992.245182
