• DocumentCode
    3368844
  • Title

    Nonparametric frequency response function estimators based on nonlinear averaging techniques

  • Author

    Guillaume, Patrick ; Pintelon, Rik ; Schoukens, Johan

  • Author_Institution
    Vrije Univ., Brussels, Belgium
  • fYear
    1992
  • fDate
    12-14 May 1992
  • Firstpage
    3
  • Lastpage
    9
  • Abstract
    Nonparametric frequency response function (FRF) estimators based on nonlinear averaging techniques are proposed. The suitability of such estimators for FFT based signal analyzers is studied. Under mild assumptions, it is shown that their bias is a function of the fourth-order moments of the perturbing errors on the input-output Fourier coefficients while the bias of the classical H1 estimator is a function of the second-order moments. The performances of these estimators are analyzed in different situations: uncorrelated input-output perturbing errors (i.e., open-loop measurements), mutually correlated input-output disturbances (i.e., closed-loop measurements) and in presence of outliers. Analytical expressions are given for the bias when the input-output errors are zero-mean normal distributed (and mutually correlated)
  • Keywords
    estimation theory; fast Fourier transforms; frequency response; signal processing; FFT; classical H1 estimator; closed-loop measurements; input-output Fourier coefficients; input-output errors; mutually correlated input-output disturbances; nonlinear averaging; nonparametric frequency response function estimators; open-loop measurements; second-order moments; signal analyzers; simulation; uncorrelated input-output perturbing errors; zero mean normal distributed errors; Additive noise; Fast Fourier transforms; Frequency estimation; Frequency measurement; Frequency response; Noise measurement; Performance analysis; Performance evaluation; Signal analysis; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
  • Conference_Location
    Metropolitan, NY
  • Print_ISBN
    0-7803-0640-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1992.245187
  • Filename
    245187