Title :
Reflectivity studies of passive microwave calibration targets and absorptive materials
Author :
Gu, Dazhen ; Cox, Amanda E. ; Houtz, Derek ; Walker, David K. ; Randa, James ; Billinger, Robert L.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We report on the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST). Three blackbody targets at variable temperatures used for airborne and/or satellite systems along with an aluminum plate were measured in terms of their reflection coefficients by horn antennas in connection with a vector network analyzer (VNA) in the WR-42 waveguide band. Precision measurements of reflection are needed for blackbody emissivity computation to check against the brightness temperature measurement of blackbody targets. All experiments were conducted in two distance ranges by free-space methods in an anechoic chamber. Preliminary results show negligible reflections from the calibration targets, indicating near ideal blackbody characteristics in the measured frequency range.
Keywords :
anechoic chambers (electromagnetic); blackbody radiation; calibration; horn antennas; microwave reflectometry; National Institute of Standards and Technology; absorptive materials; airborne systems; aluminum plate; anechoic chamber; blackbody characteristics; blackbody emissivity computation; blackbody reflections; brightness standards; brightness temperature measurement; free-space methods; horn antennas; microwave remote sensing; passive microwave calibration targets; precision measurements; reflection coefficients; reflectivity studies; satellite systems; variable temperatures; vector network analyzer; Antenna measurements; Calibration; Frequency measurement; Microwave radiometry; NIST; Reflection; Temperature measurement; Blackbody targets; brightness standard; free-space measurement; reflection coefficients;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5653688