DocumentCode
3369096
Title
Reliability Assessment of a 1 MV LTD
Author
Leckbee, J. ; Maenchen, J. ; Portillo, S. ; Cordova, S. ; Molina, I. ; Johnson, D.L. ; Kim, A.A. ; Chavez, R. ; Ziska, D.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM
fYear
2005
fDate
13-17 June 2005
Firstpage
132
Lastpage
134
Abstract
A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.
Keywords
diodes; pulse generators; reliability; timing jitter; transformers; accelerator; cavity timing jitter; electron-beam diode load; linear transformer driver; output pulse; radiography; reliability; voltage 1 MV; voltage 6 MV; Capacitors; Circuit testing; Diodes; Electronic equipment testing; Insulator testing; Laboratories; Pulse transformers; Space vector pulse width modulation; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2005 IEEE
Conference_Location
Monterey, CA
Print_ISBN
0-7803-9189-6
Electronic_ISBN
0-7803-9190-x
Type
conf
DOI
10.1109/PPC.2005.300524
Filename
4084169
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