DocumentCode
3369099
Title
Testing object-oriented programs - an integrated approach
Author
Chen, Mei-Hwa ; Kao, Howard M.
Author_Institution
State Univ. of New York, Albany, NY, USA
fYear
1999
fDate
1999
Firstpage
73
Lastpage
82
Abstract
Traditional testing techniques often overlook object-oriented faults that are either caused by inheritance and/or polymorphism features or are introduced in object management. We present an object-flow based testing strategy that utilizes two object-flow coverage criteria (all-bindings and all-du-pairs) in testing object-oriented programs. The all-bindings criterion takes inheritance and polymorphism features into account to ensure that every binding of every object is exercised under some test. The all-du-pairs criterion is applied to monitor the behavior of every object during its lifetime by keeping track of where the object is defined (d) and where such a definition is referenced or used (u). These object-flow coverage criteria can be used to develop test cases that are able to trigger object-oriented faults. Furthermore, an integrated approach that incorporates the object-flow based testing strategy with traditional testing techniques as well as state-based testing technique is introduced. The results of our empirical study conducted on three industrial systems show that, with this approach, the reliability of the systems can be improved significantly and at least 80% of the maintenance cost can be reduced
Keywords
inheritance; object-oriented programming; program testing; software maintenance; software reliability; all-bindings criterion; all-du-pairs criterion; industrial systems; inheritance; integrated approach; object behaviour monitoring; object definition-use pairs; object management; object-flow based testing strategy; object-flow coverage criteria; object-oriented fault triggering; object-oriented program testing; polymorphism; software maintenance cost reduction; state-based testing technique; system reliability; Automation; Costs; Electrical capacitance tomography; Encapsulation; Fault detection; Independent component analysis; Life testing; Microwave integrated circuits; Monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 1999. Proceedings. 10th International Symposium on
Conference_Location
Boca Raton, FL
ISSN
1071-9458
Print_ISBN
0-7695-0443-4
Type
conf
DOI
10.1109/ISSRE.1999.809312
Filename
809312
Link To Document