• DocumentCode
    3369099
  • Title

    Testing object-oriented programs - an integrated approach

  • Author

    Chen, Mei-Hwa ; Kao, Howard M.

  • Author_Institution
    State Univ. of New York, Albany, NY, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    73
  • Lastpage
    82
  • Abstract
    Traditional testing techniques often overlook object-oriented faults that are either caused by inheritance and/or polymorphism features or are introduced in object management. We present an object-flow based testing strategy that utilizes two object-flow coverage criteria (all-bindings and all-du-pairs) in testing object-oriented programs. The all-bindings criterion takes inheritance and polymorphism features into account to ensure that every binding of every object is exercised under some test. The all-du-pairs criterion is applied to monitor the behavior of every object during its lifetime by keeping track of where the object is defined (d) and where such a definition is referenced or used (u). These object-flow coverage criteria can be used to develop test cases that are able to trigger object-oriented faults. Furthermore, an integrated approach that incorporates the object-flow based testing strategy with traditional testing techniques as well as state-based testing technique is introduced. The results of our empirical study conducted on three industrial systems show that, with this approach, the reliability of the systems can be improved significantly and at least 80% of the maintenance cost can be reduced
  • Keywords
    inheritance; object-oriented programming; program testing; software maintenance; software reliability; all-bindings criterion; all-du-pairs criterion; industrial systems; inheritance; integrated approach; object behaviour monitoring; object definition-use pairs; object management; object-flow based testing strategy; object-flow coverage criteria; object-oriented fault triggering; object-oriented program testing; polymorphism; software maintenance cost reduction; state-based testing technique; system reliability; Automation; Costs; Electrical capacitance tomography; Encapsulation; Fault detection; Independent component analysis; Life testing; Microwave integrated circuits; Monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1999. Proceedings. 10th International Symposium on
  • Conference_Location
    Boca Raton, FL
  • ISSN
    1071-9458
  • Print_ISBN
    0-7695-0443-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.1999.809312
  • Filename
    809312