Title :
Evolution of embedded flash memory technology for MCU
Author_Institution :
Renesas Electron. Corp. Itami, Itami, Japan
Abstract :
Embedded flash memory technology has undergone tremendous growth of demands with various performance requirements driven by expanded applications of MCU (Micro Controller Unit) products. High temperature operations with highest reliability for auto-motive applications, very low power embedded EEPROM functions for smart-cards, and ultra low-voltage operations for medical applications are driving factors in developing embedded flash technologies. Together with evolving memory cell technology, resolving performance/power trade-offs by developing dedicated design platforms with optimized eFlash technology, memory interface & bus designs, and the whole chip design methodologies, has realized advanced MCU products line-ups by split-gate MONOS flash technology with a wide range of applied products including auto-motive and security applications.
Keywords :
EPROM; flash memories; microcontrollers; reliability; smart cards; system buses; 1970; MCU; automotive application; bus designs; chip design methodology; eFlash technology; embedded flash memory technology; memory cell technology; memory interface; microcontroller unit products; power trade-offs; reliability; security application; split-gate MONOS flash technology; Channel hot electron injection; EPROM; Logic gates; Nonvolatile memory; Split gate flash memory cells; charge-trapping flash memory cell; embedded flash memory; split-gate flash memory cell;
Conference_Titel :
IC Design & Technology (ICICDT), 2011 IEEE International Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4244-9019-6
DOI :
10.1109/ICICDT.2011.5783209