DocumentCode
3370160
Title
High level fault modeling and fault propagation in analog circuits using NLARX automated model generation technique
Author
Farooq, Muhammad Umer ; Xia, Likun ; Hussin, Fawnizu Azmadi ; Malik, Aamir Saeed
Author_Institution
Electr. & Electron. Eng. Dept., Univ. Teknol. PETRONAS, Tronoh, Malaysia
Volume
2
fYear
2012
fDate
12-14 June 2012
Firstpage
846
Lastpage
850
Abstract
It is known that fault modeling and fault propagation in analog circuits are extremely important and more challenging than in digital circuits. Several automated model generation (AMG) techniques are developed to model the nonlinear behavior of faulty analog circuits. However, most of the modeling techniques are performed under the MATLAB environment which is impractical and the models cannot be utilized in electronic circuits. To perform high level fault modeling (HLFM) and fault propagation (FP) on system level, the models need to be translated into hardware description language (HDL) models such as VHDL-AMS or Verilog-AMS models. In this paper, several faults are modeled for transistor level analog circuits using nonlinear autoregressive exogenous (NLARX) AMG technique in MATLAB. The resulting MATLAB models are translated into VHDL-AMS behavioral models. HLFM and FP are successfully implemented for benchmark analog circuits: inverting amplifier and biquadratic low-pass filter circuits.
Keywords
amplifiers; analogue circuits; autoregressive processes; biquadratic filters; electronic engineering computing; fault simulation; hardware description languages; low-pass filters; transistor circuits; MATLAB; NLARX automated model generation technique; VHDL-AMS behavioral model; biquadratic low pass filter circuits; fault propagation; hardware description language; high level fault modeling; inverting amplifier; nonlinear autoregressive exogenous AMG technique; system level fault modeling; transistor level analog circuits; Circuit faults; Computational modeling; Integrated circuit modeling; Load modeling; MATLAB; Mathematical model; Transistors; Automated Model Generation; Fault Modeling; Fault Propagation; HLFM; TLFM; VHDL-AMS;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent and Advanced Systems (ICIAS), 2012 4th International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4577-1968-4
Type
conf
DOI
10.1109/ICIAS.2012.6306132
Filename
6306132
Link To Document