• DocumentCode
    3370303
  • Title

    Characterization of leakage current on high voltage glass insulators using wavelet transform technique

  • Author

    Algeelani, Nasir Ahmed ; Piah, M. Afendi M

  • Author_Institution
    Inst. of High Voltage & High Current, Univ. Teknol. Malaysia, Skudai, Malaysia
  • Volume
    2
  • fYear
    2012
  • fDate
    12-14 June 2012
  • Firstpage
    882
  • Lastpage
    885
  • Abstract
    The measurement and analysis of leakage current (LC) for condition-based monitoring and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Leakage current plays an important role in the detection of insulator´s condition. This paper proposes a method for reducing the noise included in the current signal. The tests were carried out on cleaned and polluted glass insulators by using surface tracking and erosion test procedure of IEC 60587. Wavelet analysis method is used to compress the leakage current data. Experimental results shows that the actual signals of leakage current are related to the levels of insulator contamination.
  • Keywords
    IEC standards; flashover; insulator contamination; interference suppression; leakage currents; wavelet transforms; IEC 60587; LC; condition-based monitoring; current signal; erosion test procedure; flashover prediction; high voltage glass insulators; insulator contamination; leakage current characterization; noise reduction; polluted insulators; surface tracking; wavelet transform technique; Flashover; Insulators; Leakage current; Surface contamination; Surface discharges; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent and Advanced Systems (ICIAS), 2012 4th International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4577-1968-4
  • Type

    conf

  • DOI
    10.1109/ICIAS.2012.6306139
  • Filename
    6306139