Title :
Ambient noise cancellation in frequency domain EMI measurement
Author :
Xu, Jian ; Dai, Fei ; Su, Donglin ; Qiao, Qi ; Zheng, Haopeng
Author_Institution :
Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
Abstract :
In this paper, an advanced signal processing technique for measurements of electromagnetic interference from electronic devices will be presented. Lower and lower ambient noise is preferred in electromagnetic interference measurement. Not all the device producers can pay for darkroom measurement, because it real costs a lot. This method provides an opportunity to perform an electromagnetic interference measurement at a site polluted by electromagnetic ambient noise. Resulted from a real device under test, automatic measurement with this method that successfully cancels the ambient noise will be presented.
Keywords :
automatic testing; electromagnetic interference; frequency measurement; frequency-domain analysis; interference suppression; signal processing; advanced signal processing technique; ambient noise cancellation; automatic measurement; darkroom measurement; device under test; electromagnetic interference; electromagnetic interference measurement; frequency domain EMI measurement; Antenna measurements; Electromagnetic compatibility; Electromagnetic interference; Equations; Mathematical model; Noise; Noise measurement; EMI measurement; ambient noise cancellation; frequency domain;
Conference_Titel :
Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8265-8
DOI :
10.1109/MAPE.2011.6156142