DocumentCode
3370765
Title
Automatic dependability analysis for supporting design decisions in UML
Author
Bondavalli, Andrea ; Majzik, Istvan ; Mura, Ivan
Author_Institution
Istituto CNUCE, CNR, Pisa, Italy
fYear
1999
fDate
1999
Firstpage
64
Lastpage
71
Abstract
Even though a thorough system specification improves the quality of the design, it is not sufficient to guarantee that a system will satisfy its reliability targets. Within this paper, we present an application example of one of the activities performed in the European ESPRIT project HIDE, aiming at the creation of an integrated environment where design toolsets based on UML are augmented with modeling and analysis tools for the automatic validation of the system under design. We apply an automatic transformation from UML diagrams to Timed Petri Nets for model based dependability evaluation. It allows a designer to use UML as a front-end for the specification of both the system and the user requirements, and to evaluate dependability figures of the system since the early phases of the design, thus obtaining precious clues for design refinement. The transformation completely hides the mathematical background, thus eliminating the need for a specific expertise in abstract mathematics and the tedious remodeling of the system for mathematical analysis
Keywords
Petri nets; fault tolerant computing; formal specification; software fault tolerance; systems analysis; European ESPRIT project HIDE; UML; abstract mathematics; application example; automatic dependability analysis; design decisions; design toolsets; integrated environment; mathematical analysis; model based dependability evaluation; reliability targets; system specification; timed Petri nets; user requirements; Bonding; Control system synthesis; Design methodology; Mathematical analysis; Mathematics; Open systems; Performance analysis; Pervasive computing; Petri nets; Unified modeling language;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Assurance Systems Engineering, 1999. Proceedings. 4th IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7695-0418-3
Type
conf
DOI
10.1109/HASE.1999.809476
Filename
809476
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