DocumentCode
3370857
Title
Transcutaneous electrical stimulation devices tests
Author
Kantor, Gideon ; Alon, Gad
Author_Institution
Med. Sch., Maryland Univ., Baltimore, MD, USA
Volume
5
fYear
1996
fDate
31 Oct-3 Nov 1996
Abstract
At the present time, there is only one standard test that evaluates the performance of transcutaneous electrical nerve stimulator (TENS) devices. The rationale for this test is not well documented and its scope and limitations are unclear. The thrust of this paper is to discuss the selected factors that are likely to affect the performance standard. These include stimulus waveform, constant current versus constant current voltage output and electrode size. Each of these parameters have been shown to influence the stimulation output and the conductive characteristics of human tissue. Stimulating with different waveforms significantly affects peak current, peak voltage and total pulse charge, but insignificantly affects the phase charge. Using a different electrode size alter all stimulus output values during excitation of peripheral nerves, indicating tile need to specify electrode size for simulated tissue loads. Data show that a single load is not adequate to simulate the conductive medium of human tissue. Instead a family of loads is considered and their validation for testing conditions is discussed
Keywords
bioelectric phenomena; electrodes; neurophysiology; orthotics; skin; testing; constant current; constant voltage output; electrode size; human tissue; peak current; peak voltage; performance standard; peripheral nerves excitation; phase charge; stimulation output; stimulus waveform; total pulse charge; transcutaneous electrical stimulation devices tests; Biological system modeling; Electrical stimulation; Electrodes; Humans; Medical tests; Muscles; Pain; Production; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location
Amsterdam
Print_ISBN
0-7803-3811-1
Type
conf
DOI
10.1109/IEMBS.1996.646492
Filename
646492
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