Title :
Simulation of shielding effectiveness test with bounded-wave EMP simulator
Author :
Wei, Wang ; Zhao, Jing-jing ; Chen, Bin ; Zhou, Bi-Hua
Author_Institution :
Nat. Key Lab. on Electromagn. Environ. Effects & Electro-Opt. Eng., Univ. of Sci. & Tech., Nanjing, China
Abstract :
The shielding effectiveness (SE) test is usually implemented in the bounded-wave simulator. However, numerical simulating the SE of a shielding enclosure is mostly modeled with plane wave incidence. In this paper we present the parallel FDTD method to analyze the SE of a shielding enclosure in bounded-wave simulator. An improved formalism for thin slot is adopted. The result shows that the result obtained in the simulator is higher than the plane wave simulating result. From the numerical results, we can find the law of the results between bounded-wave simulator model and the plane wave model.
Keywords :
finite difference time-domain analysis; numerical analysis; shielding; FDTD method; bounded-wave EMP simulator; bounded-wave simulator model; numerical simulating; plane wave incidence; plane wave model; shielding effectiveness test; shielding enclosure; Difference equations; Finite difference methods; Mathematical model; Metals; Numerical models; Time domain analysis; Bounded-wave simulator; FDTD; shielding effectiveness; thin slot;
Conference_Titel :
Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8265-8
DOI :
10.1109/MAPE.2011.6156178
