DocumentCode
3371064
Title
Indium phosphide crystal growth from phosphorus-rich melt
Author
Sun, Niefing ; Mao, Luhong ; Zhou, Xiaulong ; Wu, Xawan ; Guo, Weilzun ; Hu, Ming ; Li, Lingxiu ; Mi Xiao ; Liao, Bin ; Yang, Guangyao ; Fu, Jiande ; Yao, Zhihong ; Zhao, Yanjun ; Yang, Kewu ; Sun, Tongnian
Author_Institution
Sch. of Electron. Inf. Eng., Tianjin Univ., China
fYear
2004
fDate
31 May-4 June 2004
Firstpage
326
Lastpage
329
Abstract
P-rich of InP crystals are rather difficult to achieve, due to the high phosphorus pressure at the melting point. By using the P-injection in-situ synthesis method, there is excessive phosphorus in the melt. In the conditions of MIn < MIn-s, [P]mol>[In]mol, the melt might be P-rich. Since a high thermal stress exists in the LEC growth process with large temperature gradient, it is difficult to release stress, a large number of dislocations come into being around the pores. The pores are distributed in the ingots irregularly. The diameter of the pores is from <0.5 mm to 15 mm on the same wafer. The polished sample wafers with pores were characterized by PL mapping. Dislocations and pores in InP ingots are investigated by means of chemical etching, scanning electron microscopy (SEM). The experimental results show that the cell structures induced by movement and reaction of higher density dislocations exist at the edge of the pores. The EPD around the pores are higher than the other regions and the PL intensities are also inhomogeneous.
Keywords
III-V semiconductors; crystal growth from melt; dislocations; etching; indium compounds; ingots; melting point; photoluminescence; porous semiconductors; scanning electron microscopy; semiconductor growth; thermal stresses; InP; LEC growth; P-injection in-situ synthesis method; PL mapping; SEM; chemical etching; dislocations; indium phosphide crystal growth; ingots; melting point; phosphorus-rich melt; scanning electron microscopy; thermal stress; Chemicals; Costs; Crystals; Etching; Indium phosphide; Scanning electron microscopy; Substrates; Temperature; Thermal factors; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on
ISSN
1092-8669
Print_ISBN
0-7803-8595-0
Type
conf
DOI
10.1109/ICIPRM.2004.1442721
Filename
1442721
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