• DocumentCode
    337129
  • Title

    Stability and sensitivity analysis of periodic orbits in tapping mode atomic force microscopy

  • Author

    Salapaka, Murti V. ; Chen, D.J. ; Cleveland, J.P.

  • Author_Institution
    Dept. of Electr. Eng., Iowa State Univ., Ames, IA, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    16-18 Dec 1998
  • Firstpage
    2047
  • Abstract
    In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed
  • Keywords
    asymptotic stability; atomic force microscopy; nonlinear dynamical systems; sensitivity analysis; Poincare method; asymptotic stability; atomic force microscopy; cantilever; imaging; nonlinear dynamic systems; periodic orbits; resonant frequency; sensitivity analysis; stability; tapping mode; Atomic force microscopy; Force control; Optical imaging; Optical sensors; Orbits; Photodiodes; Resonant frequency; Sensitivity analysis; Silicon; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1998. Proceedings of the 37th IEEE Conference on
  • Conference_Location
    Tampa, FL
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-4394-8
  • Type

    conf

  • DOI
    10.1109/CDC.1998.758635
  • Filename
    758635
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=337129