Title :
Stability and sensitivity analysis of periodic orbits in tapping mode atomic force microscopy
Author :
Salapaka, Murti V. ; Chen, D.J. ; Cleveland, J.P.
Author_Institution :
Dept. of Electr. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed
Keywords :
asymptotic stability; atomic force microscopy; nonlinear dynamical systems; sensitivity analysis; Poincare method; asymptotic stability; atomic force microscopy; cantilever; imaging; nonlinear dynamic systems; periodic orbits; resonant frequency; sensitivity analysis; stability; tapping mode; Atomic force microscopy; Force control; Optical imaging; Optical sensors; Orbits; Photodiodes; Resonant frequency; Sensitivity analysis; Silicon; Stability analysis;
Conference_Titel :
Decision and Control, 1998. Proceedings of the 37th IEEE Conference on
Conference_Location :
Tampa, FL
Print_ISBN :
0-7803-4394-8
DOI :
10.1109/CDC.1998.758635
