DocumentCode :
3371323
Title :
Intra-prediction for color image coding using YUV correlation
Author :
Lucas, Luís F R ; Rodrigues, Nuno M M ; De Faria, Sérgio M M ; da Silva, Eduardo A B ; De Carvalho, Murilo B. ; da Silva, Vitor M M
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
1329
Lastpage :
1332
Abstract :
In this paper we present a new algorithm for chroma prediction in YUV images, based on inter component correlation. Despite the YUV color space transformation for inter component decorrelation, some dependency still exists between the Y, U and V chroma components. This dependency has been previously used to predict the chrominance data from the reconstructed luminance. In this paper we show that a chrominance component can be more efficiently predicted by using the reconstructed data from both the luminance and the remaining chrominance signal. The proposed chroma prediction is implemented and tested using the Multidimensional Multiscale Parser (MMP) image encoding algorithm. It is shown that the new color prediction mode outperforms the originally proposed prediction methods. Furthermore, by using the new color prediction scheme, MMP is consistently better than the state-of-the-art H.264/AVC for coding both for the luminance and the chrominance image components.
Keywords :
image coding; image colour analysis; image reconstruction; H.264/AVC; YUV color space transformation; YUV correlation; YUV image; chroma prediction; chrominance data; chrominance image component; chrominance signal; color image coding; color prediction mode; color prediction scheme; inter component correlation; inter component decorrelation; multidimensional multiscale parser image encoding algorithm; reconstructed luminance; Automatic voltage control; Correlation; Image coding; Image color analysis; Image segmentation; Prediction algorithms; Transform coding; Color Image Coding; Inter-Component Correlation; Intra Prediction; Recurrent Pattern Matching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5653834
Filename :
5653834
Link To Document :
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